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Raman Technique in Determination of Size Distribution of Oxide and Semiconductor Nanoparticles
Author(s): M.Ivanda, K.Furi (c′), S.Musi (c′), M.Goti (c′), M.Risti (c′), A.Turkovi (c′), A.M.Tonejc, I.Derd, Z.CrnjakOrel, M.Montagna, M.Ferrari, M.Schmitt, K.Babocsi, W.Kiefer
Pages: 245-
247
Year: 2005
Issue:
3
Journal: CHINESE JOURNAL OF LIGHT SCATTERING
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