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ji yu iec61508 biao zhun de gong neng an quan xin pian she ji fang fa tan tao
Author(s): GU Yingke, CUI Tongbing, REN Jun, LIN Ziming
Pages: 1-
5
Year: 2016
Issue:
5
Journal: Railway Signalling & Communication Engineering
Keyword: functional safety; V-model; 1 out of 2 redundancy; lock step technology; redundant check;
Abstract: Due to the rapid development of integrated circuit design and manufacturing technologies, chip-level functional safety-related devices have made great progress. The development & validation methodology of functional safety- related IC has become the focus of the industry. This paper discusses the functional safety techniques introduced in IEC61508 standard, summarizes the main technical characteristics of functional safety-related IC at present, and presents a V-model for functional safety-related IC development based on the analysis of IEC61508 standard. Finally, it puts forward a complete methodology of functional safety-related IC development conforming to IEC61508 to design an ASIC, and gives a short conclusion on the design result.
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