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he jin zhu gang de xian wei pian xi yu jing jian cui xing
Author(s): 
Pages: 38-43
Year: Issue:  3
Journal: Materials Science and Technology

Keyword:  晶间脆性杂质元素显微偏析沿晶脆性断裂奥氏体晶界低合金铸钢离子探针沿晶断裂俄歇电子能谱仪工艺试验;
Abstract: 对两种低合金铸钢的沿晶脆性断裂现象进行了研究,结果表明,两种脆化材料的断口均为沿晶脆性断裂。在沿晶面上观察到生长完善的枝晶结构和疏松露头。透射电镜观察与电子衍射分析确认,有薄膜状第二相沿晶间和枝晶沉淀。用俄歇电子能谱仪和离子探针测定了脆性断裂面上杂质元素的偏析,结果表明,沿晶表面上存在H,C,O,N和S的偏析,尤其以O的偏析为甚。经冶炼工艺试验证实,引起两种铸钢的晶间脆性的主要原因是AlN沿初生奥氏体晶界和枝晶间的沉淀,而H,O,N,C等杂质元素的偏聚促进了这种脆性现象的发生。
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