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shi xi xin xing ic zhi neng ce shi yi de yuan li jie gou ji qi shi yong fang fa
Author(s): 
Pages: 43-45
Year: Issue:  4
Journal: JOURNAL OF HIGHER CORRESPONDENCE EDUCATION(NATURAL SCIENCES)

Keyword:  IC芯片单片机智能化测试仪;
Abstract: IC芯片商家及用户在使用IC芯片过程中需对IC芯片进行测试,以判断其好坏.开发通用集成电路测试仪是解决这一问题的一条有效途径.本文分析了江汉大学的一项科研成果"IC智能测试仪"的测试原理、系统结构及使用方法.
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