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The Scanning Tunneling Microscope Employed in the Scanning Probe Electron Energy Spectrometer
Pages: 1320-1324
Year: Issue:  11
Journal: Vacuum Science and Technology

Keyword:  STMScanning probe electron energy spectrometerUHVIn situ;
Abstract: A novel scanning probe electron energy spectrometer( SPEES),a combination of scanning tunneling microscope( STM) and electron energy analyzer,was sucessfully developed,which is capable of measuring surface microstructures at an atomic scale in STM mode and alternatively evaluating in-situ the surface electronic structures in ultra high vacuum( UHV) in SPEES-mode for spectrocopic mapping. In the lab-built,compact,rigid and stable STM,the sample and tip are fixed on a pair of vertical piezo-tubes,respectively; and the horizontally orienteated sample-tip distance can be precisely adjusted by the inertia motor and the piezo tube,respectively. The surface atomic image of highly oriented pyrolytic graphite( HOPG) was observed in STM mode in ambient environment; and the Ag thin films deposited on HOPG was imaged in STM mode,and then the electron back-scattering spectrum was in-situ investigated in SPEES mode in UHV.
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