Author(s): Li Meng, Xu Chunkai, Chen Xiangjun, Department of Modern Physics and Hefei National Laboratory for Physical Science at Microscale, University of Science and Technology of China
Pages: 1320-1324
Year: 2016 Issue:  11
Journal: Vacuum Science and Technology
Keyword:  STM; Scanning probe electron energy spectrometer; UHV; In situ;
Abstract: A novel scanning probe electron energy spectrometer( SPEES),a combination of scanning tunneling microscope( STM) and electron energy analyzer,was sucessfully developed,which is capable of measuring surface microstructures at an atomic scale in STM mode and alternatively evaluating in-situ the surface electronic structures in ultra high vacuum( UHV) in SPEES-mode for spectrocopic mapping. In the lab-built,compact,rigid and stable STM,the sample and tip are fixed on a pair of vertical piezo-tubes,respectively; and the horizontally orienteated sample-tip distance can be precisely adjusted by the inertia motor and the piezo tube,respectively. The surface atomic image of highly oriented pyrolytic graphite( HOPG) was observed in STM mode in ambient environment; and the Ag thin films deposited on HOPG was imaged in STM mode,and then the electron back-scattering spectrum was in-situ investigated in SPEES mode in UHV.