Author(s): HU Chun-tian, ZHANG Hua
Pages: 52-55
Year: 2014 Issue:  5
Journal: Environmental Technology
Keyword:  failure analysis; decap; microsection; SEM (scanning electron microscope); EDS (energy disperse spectroscopy);
Abstract: This paper introduces the common means of LED failure analysis, mainly including visual inspection, electrical performance test, X-Ray inspection, decapsulation inspection, microsection inspection, SEM & EDS analysis, etc., and it describes these methods combined with actual cases.