Variance analysis in the application of the laser point source quality evaluation
Author(s): AN Qi-chang, ZHANG Jing-xu, YANG Fei, GUO Peng
Pages: 977-981
Year: 2014 Issue: 9
Journal: Laser & Infrared
Keyword: point source; variance analysis; system error; stochastic error; TMT;
Abstract: In order to evaluate the laser point source,the variance analysis is introduced to study its stochastic error and system error.Firstly,the theory statistics modal of ideal point source is built to specify the basic statistics proper-ty.Then,variance analysis is introduced to the evaluation of laser point source,and a method to measure the uniformi-ty of laser point source is proposed.The luminous mass of certain point source was evaluated with the method;error distribution of the system is uniform at the confidence probability of 0.99,which verifies the correctness of this theory and the feasibility of this method.Lastly,taking the TMT for example,this method is considered in the application of optoelectronic system variance analysis of the next generation large aperture telescope.This method has a certain guiding significance for the laser point source evaluation,and it is helpful for error analysis of optoelectronic system.
Pages: 977-981
Year: 2014 Issue: 9
Journal: Laser & Infrared
Keyword: point source; variance analysis; system error; stochastic error; TMT;
Abstract: In order to evaluate the laser point source,the variance analysis is introduced to study its stochastic error and system error.Firstly,the theory statistics modal of ideal point source is built to specify the basic statistics proper-ty.Then,variance analysis is introduced to the evaluation of laser point source,and a method to measure the uniformi-ty of laser point source is proposed.The luminous mass of certain point source was evaluated with the method;error distribution of the system is uniform at the confidence probability of 0.99,which verifies the correctness of this theory and the feasibility of this method.Lastly,taking the TMT for example,this method is considered in the application of optoelectronic system variance analysis of the next generation large aperture telescope.This method has a certain guiding significance for the laser point source evaluation,and it is helpful for error analysis of optoelectronic system.
Related Articles