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Back-thining on Reliability Influence for MW 320×256 MCT IRFPA
Pages: 629-631
Year: Issue:  10
Journal: Infrared Technology

Keyword:  back-thiningIRFPAwork life;
Abstract: The article devises and accomplishes the reliability experiment for A type ( preliminary back-thining ) and B type ( ultimate back-thining ) of MW 320 × 256MCT IRFPA. The photoelectric characteristic of A type and B type is compared after experiment. The preliminary assessment is done for B type on work life.
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