The server is under maintenance between 08:00 to 12:00 (GMT+08:00), and please visit later.
We apologize for any inconvenience caused
Login  | Sign Up  |  Oriprobe Inc. Feed
China/Asia On Demand
Journal Articles
Laws/Policies/Regulations
Companies/Products
Bookmark and Share
Back-thining on Reliability Influence for MW 320×256 MCT IRFPA
Author(s): 
Pages: 629-631
Year: Issue:  10
Journal: Infrared Technology

Keyword:  back-thiningIRFPAwork life;
Abstract: The article devises and accomplishes the reliability experiment for A type ( preliminary back-thining ) and B type ( ultimate back-thining ) of MW 320 × 256MCT IRFPA. The photoelectric characteristic of A type and B type is compared after experiment. The preliminary assessment is done for B type on work life.
Related Articles
No related articles found