Author(s): TIAN Li-ping, ZHU Ying-feng, LIU Xiang-yun, GUO Jian-hua
Pages: 629-631
Year: 2013 Issue:  10
Journal: Infrared Technology
Keyword:  back-thining; IRFPA; work life;
Abstract: The article devises and accomplishes the reliability experiment for A type ( preliminary back-thining ) and B type ( ultimate back-thining ) of MW 320 × 256MCT IRFPA. The photoelectric characteristic of A type and B type is compared after experiment. The preliminary assessment is done for B type on work life.