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Pulse laser damage characteristic measurement of VO2 optical thin film
Author(s): HAN Wen-qin, GUO Xi-qing, XIE Guan-bao, SUN Peng-fei, YANG Jing-xian, TANG Ya-jun
Pages: 690-
694
Year: 2013
Issue:
4
Journal: Journal of Applied Optics
Keyword: laser technology; vanadium dioxide film; damage feature;
Abstract: 为评价VO2光学薄膜在光电器件中的工作可靠性,搭建了可输出连续渐变激光能量密度的脉冲激光照射实验平台,运用“1对1”与“s对1”2种激光损伤测试手段进行激光辐射照射实验,采用线性外推法和测量计算法2种方法对实验结果进行了处理并得出VO2薄膜在重复频率10 kHz、中心波长532 nm、脉冲宽度15 ps脉冲激光辐射下的损伤特性.结果表明:VO2薄膜损伤几率与脉冲激光的单脉冲能量密度呈线性关系,重复辐射的激光脉冲对VO2薄膜造成的损伤具有积累效应,且重复辐射的激光脉冲次数越多损伤积累效果越明显.
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