The server is under maintenance between 08:00 to 12:00 (GMT+08:00), and please visit later.
We apologize for any inconvenience caused
Login  | Sign Up  |  Oriprobe Inc. Feed
China/Asia On Demand
Journal Articles
Laws/Policies/Regulations
Companies/Products
Bookmark and Share
Measurement of the reflection curve of crystals used in the monochromator of X-ray diffraction Beamline at NSRL
Author(s): 
Pages: 541-542
Year: Issue:  6
Journal: OPTICAL TECHNIQUE

Keyword:  晶体衍射本征宽度;
Abstract: 合肥X射线衍射光束线装备了一台以两晶体无色散(+n,-n)排列,能量可连续扫描,空间位置固定输出为特点的双晶单色仪.选用单晶硅作为分光元件,它所对应的不同能量产生的全反射的本征宽度决定了双晶单色仪的分辨率.因此,晶体在投入使用之前,测量它的本征宽度,为单色仪的调试提供依据是非常必要的.介绍了用于合肥X射线衍射光束线单色仪中两块晶体的测量,包括测试方法、装置、测量结果和分析.
Related Articles
No related articles found