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Microstructure Analysis of the CdTe Thin Film
Author(s): 
Pages: 508-512
Year: Issue:  5
Journal: ACTA SCIENTIARUM NATURALIUM UNIVERSITATIS NEIMENGGOL

Keyword:  CdTe薄膜掺杂结构;
Abstract: 应用真空蒸发技术制备CdTe薄膜,并借助于扫描电子显微镜(SEM)、扫描俄歇谱仪(AES)和X射线衍射仪(XRD)对其微观结构进行分析.主要研究了不同工艺条件、不同原子配比、以及不同掺杂浓度下制得的CdTe薄膜的结构、物相,研究结果表明:以Cd:Te=0.9:1原子配比制得的CdTe薄膜具有最佳的结晶度和组分计量比;掺杂会使CdTe薄膜的结构、物相有所改变.
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