The server is under maintenance between 08:00 to 12:00 (GMT+08:00), and please visit later.
We apologize for any inconvenience caused
Login  | Sign Up  |  Oriprobe Inc. Feed
China/Asia On Demand
Journal Articles
Laws/Policies/Regulations
Companies/Products
Bookmark and Share
Study on the corona-resistance mechanism of the polyimide films
Author(s): 
Pages: 28-31
Year: Issue:  5
Journal: Electric Machines and Control

Keyword:  纳米掺杂聚酰亚胺载流子陷阱耐电晕;
Abstract: 为了探讨聚酰亚胺薄膜绝缘材料耐电晕机理,对自制纳米杂化聚酰亚胺(PI)薄膜进行不同时间的电晕预处理,并对电晕预处理后的试样分别进行电晕老化与热激电流(TSDC)测试,结果发现在适当的电晕预处理条件下,纳米杂化PI薄膜的耐电晕寿命会得到提高,且薄膜耐电晕寿命、热激电流活化能都与薄膜电晕预处理时间存在一定关系,二者变化趋势大致相同.分析表明纳米杂化PI薄膜的耐电晕寿命与其中受陷载流子的状态有关,当材料中均匀分布能级较深的稳定的载流子陷阱时,材料表现出较好的耐电晕性能.
Related Articles
No related articles found