The server is under maintenance between 08:00 to 12:00 (GMT+08:00), and please visit later.
We apologize for any inconvenience caused
Login  | Sign Up  |  Oriprobe Inc. Feed
China/Asia On Demand
Journal Articles
Laws/Policies/Regulations
Companies/Products
A Simplified Inherited Testability Evaluation Method for Analog Circuit
Author(s): 
Pages: 25-29
Year: Issue:  5
Journal: ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING

Keyword:  测试性评价符号化分析方法测试性矩阵故障诊断和定位;
Abstract: 模拟电路的测试性是进行故障诊断和定位的重要依据.采用基于符号化的分析方法来进行测试性评价,相对于数值计算的方法更有优势.提出了一种测试性矩阵的构建方法,同时给出并证明了基于该测试矩阵进行测试性评价的方法.该评价方法的特点是计算简单实用,且消除了计算误差.最后,通过电路实例,验证了该方法的有效性及其实现上的简洁性.
Related Articles
loading...