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Author:
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Year:
Volume:
Issue:
A Simplified Inherited Testability Evaluation Method for Analog Circuit
Author(s):
CHEN Xiao-mei
Pages:
25
-
29
Year:
2007
Issue:
5
Journal:
ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING
Keyword:
测试性评价
;
符号化分析方法
;
测试性矩阵
;
故障诊断和定位
;
Abstract:
模拟电路的测试性是进行故障诊断和定位的重要依据.采用基于符号化的分析方法来进行测试性评价,相对于数值计算的方法更有优势.提出了一种测试性矩阵的构建方法,同时给出并证明了基于该测试矩阵进行测试性评价的方法.该评价方法的特点是计算简单实用,且消除了计算误差.最后,通过电路实例,验证了该方法的有效性及其实现上的简洁性.
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