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Power Cycle Fatigue Lifetime Prediction of IGBT Module
Author(s): 
Pages: 12-17
Year: Issue:  2
Journal: Electronic Product Reliability and Environmental Testing

Keyword:  功率循环铝键合线有限元法疲劳寿命;
Abstract: 随着IGBT功率模块的广泛应用,其功率循环可靠性问题得到关注和重视.介绍了模块的功率循环失效机理,指出铝键合线剥离是模块功率循环失效的原因;基于有限元法计算了模块在功率循环过程中的温度分布与变化,并在此基础上计算了模块的应力应变:根据应力应变数值的计算结果,分别采用应变能法和应变法等两种疲劳破坏准则,预测了键合线疲劳寿命.研究表明,铝键合线根部为模块的疲劳危险区:随着芯片热损耗的增加,芯片结温变化幅度的增加,功率模块疲劳寿命急剧地减小.
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