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Applicability of Hampton Criterion for Insulator DC Pollution Flashover
Author(s): 
Pages: 2639-2644
Year: Issue:  11
Journal: High Voltage Engineering

Keyword:  绝缘子污闪直流Hampton判据Obenaus模型误差;
Abstract: 直流污闪模型中可用Hampton判据来获得闪络的临界弧长,但该方法在某情况下存在误差.因此分析了直流情况下基于Obenaus模型的污闪电压预测方法的原理,指出并证明了当不考虑弧根半径的影响时临界弧长仅与泄漏距离L和电弧参数n有关,而与其它因素无关,Hampton判据完全正确,并通过计算进行了验证.考虑弧根半径的影响时根据Hampton判据预测的直流污闪电压存在误差,其值略低于模型实际预测的污闪电压...
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