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Hardness Enhancement of CrN Coatings by C-Doping
Author(s): 
Pages: 158-162
Year: Issue:  2
Journal: Vacuum Science and Technology

Keyword:  磁控溅射 CrCN镀层 原子力显微镜 X射线衍射 X射线光电子能谱;
Abstract: 采用闭合场非平衡磁控溅射离子镀技术在单晶硅(111)衬底上沉积了CrCN镀层以研究C靶电流对镀层显微硬度的影响,并通过X射线衍射、原子力显微镜、X射线光电子能谱和透射电镜对镀层进行了分析。结果表明:当C靶电流由0增加到1.5 A时,镀层显微硬度由1930 HV增加到2300 HV,提高约19%,并且镀层的颗粒明显变小;X射线衍射和透射电镜分析表明,随着C靶电流增大,镀层由晶态向非晶态转变;X射线光电子能谱分析表明,镀层碳元素主要以sp2键、sp3键和C-Cr键的形式存在。
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