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Research and Develop IEEE 1149.1 Testability Design
Author(s): 
Pages: 28-30
Year: Issue:  1
Journal: MEASUREMENT & CONTROL TECHNOLOGY

Keyword:  可测试性可测试性设计边界扫描测试IEEE1149.1标准;
Abstract: 在分析VLSI可测试性设计技术的发展情况和设计准则的基础上,讨论了研究与发展IEEE 1149.1可测试性设计技术的重要意义,以及该技术在我国民用和军用工业应用的前景.
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