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Research on the key technologies in an improved D-algorithm test generation
Author(s): 
Pages: 1-3,32
Year: Issue:  10
Journal: Electronic Measurement Technology

Abstract: 数字电路测试的关键在于算出测试向量,本文基于传统D算法思想提出了一种改进型的D算法.与前者相比,新算法的主要优点是:(1)加快测试向量生成的速度;(2)提高了故障覆盖率.研究了新算法的关键技术,包括D立方设计、D立方的读入和初始D路径敏化等.经实例验证,测试程序自动生成了测试向量,说明改进后的D算法是一种有效的测试生成算法,为自动测试生成系统的设计奠定了基础.
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