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Ferroelectric Properties of Bi3.25La0.75Ti2.94Nb0.06O12 Ferroelectric Thin Films Prepared by Sol-gel Method
Author(s): 
Pages: 30-34
Year: Issue:  2
Journal: ELECTRICAL ENGINEERING MATERIALS

Keyword:  Sol-gel法铁电薄膜BLTN微观结构性能;
Abstract: 采用溶胶-凝胶法(Sol-gel)在p-Si和Pt/Ti/SiO2/Si衬底上制备Bi3.25La0.75Ti2.94Nb0.06O2(BLTN)铁电薄膜,研究了BLTN薄膜的晶相结构、表面形貌、铁电性能、介电性能和C-V性能.结果表明:所制备的BLTN薄膜具有单一的层状钙钛矿结构,且为随机取向;高于650℃退火处理的BLTN薄膜表面平整致密;铁电性能测试显示较饱和的电滞回线;当退火温度为650℃时,其剩余极化Pr和Ec分别为24.6μC/cm2和96.8 kV/cm,明显优于Bi3Ti4O12(BIT)薄膜的铁电性能;室温下,当测试频率为10kHz时,薄膜的介电常数为386,介电损耗为0.69%,具有良好的介电性能;C-V曲线为顺时针方向回滞,记忆窗口约为1.5V,可以实现极化存储.
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