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Embedded System Test Card Design Based on Visual Com Port
Author(s): 
Pages: 54-55
Year: Issue:  2
Journal: INSTRUMENTATION TECHNOLOGY

Keyword:  FTDI245ATMEGA32SPIUSB;
Abstract: 论述利用FTDI245和ATMEGA单片机组成的测试卡对嵌入式系统进行测试,阐述信号传输的原理、方法和系统的实现,同时对相应的固件程序设计进行简要描述.
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