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Research on IC failure analysis method
Author(s): 
Pages: 168-169
Year: Issue:  4
Journal: ELECTRONIC MEASUREMENT TECHNOLOGY

Keyword:  失效分析无损探伤热点捕捉;
Abstract: 与传统的分析方法相比较,文中设计优化了失效分析方案.采用先进的Light emission、SAM等技术,提高了集成电路失效分析的成功率和准确度.对IC的设计、研究和生产有积极的指导作用.
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